Sharing Test Programs Using Easy-Wire Export & Import Best Practices When Sharing Test Programs Between Cable Testers The Cirris Server Software allows multiple test stations to share a single Easy-Wire…
Dielectric Withstanding Voltage Leakage Current Limit Are you setting your DWV leakage current pass/fail threshold too low? The Dielectric Withstand Voltage (DWV) test, also sometimes referred to as a “Hipot”…
General Testing GuidelinesDiagnosing FailuresHigh VoltageSpecial TopicsGuidelines ⬅Return 5 Questions You Should Ask Yourself About Fixturing An Introduction to A-620 Cable Testing Standard Are Your Resistance Settings Correct? Cable Testing Glossary…
Testing for Intermittent Errors in Cable and Harness Assemblies Just because a cable has tested good does not mean that it is definitely a good cable. This article will discuss…
Connector Pin Counting Sequence Alternating count, or sometimes called Staggered count. This is a very typical counting pattern for dual row headers of all kinds. The different families of Cirris adapters…
Functional Testing This article should help you understand functional testing, how to apply it correctly, and issues to consider when choosing a tester with functional test capability. Functional Testing Defined…
Does repeating the Hipot test damage your cable? Cirris cable hipot testers are designed to limit the current and the charge that is applied during the hipot test. * Consequently,…
Connector Contact Retention A key problem with wire harness assemblies constructed with crimp and poke style terminations is contact retention failures or terminal “push back.” Of primary concern are those…
Common Causes and Solutions of Testing Errors Finding the causes of errors then implementing the correct solution can be a confusing task. There are so many reasons an error can…
Temperature Coefficient of Resistance for Copper The Temperature Coefficient of Resistance for Copper (near room temperature) is 0.393% per degree Celsius (C) meaning that for every 1°C rise in temperature,…
